Hitachi S-4700 FE-SEM

The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope. This SEM permits ultra high resolution imaging of thin films and semi-conductor materials on exceptionally clean specimens. It is also suitable for polymeric materials. The S-4700 is configured to detect secondary and backscattered electrons as well as characteristic X-rays. The system is fully automated and is operated via easy-to-use menu driven software. Specifications:
  • Accelerating voltage range: from 0.5 keV to 30 keV.
  • 2.5 nm resolution at 1kV; 1.5 nm resolution at 15 kV.
  • Magnification range: from 30X to 500.000X.
  • PC-controlled five axis motorized stage.
  • Specimen stage rotation 360˚ in continuous mode.
  • Specimen tilt at 12mm working distance (WD) up to 45
  • Electron gun…. Cold cathode FE type
  • Extracting voltage… 0 to 6.5 KV
  • Type II stage.

Hitachi S3000N
Variable Pressure
Scanning Electron Microscope

Click to Download S3000N Specifications

Hitachi S-2600N with Xray system and processor

FEI Morgagni 268

ABT 32 System

- SE, BSE detectors.
- Tungsten electron source.
- 2,5,10,15,25,30 Beam energy
- 5 nm resolution
- Magnification: 20x to 25kx
System includes:
Water chiller, digital image processor, sputter coater .

Please contact us for pricing and questions on the used scanning electron microscopes that we are offering for sale. All scanning and transmission electron microscopes for sale are fully operational and serviced.