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Hitachi S-4700 FE-SEM
The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope.
This SEM permits ultra high resolution imaging of thin films and semi-conductor materials on exceptionally clean specimens.
It is also suitable for polymeric materials. The S-4700 is configured to detect secondary and backscattered electrons as well as characteristic X-rays.
The system is fully automated and is operated via easy-to-use menu driven software.
Specifications:
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