The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope. This SEM permits ultra high resolution imaging of thin films and semi-conductor materials on exceptionally clean specimens. It is also suitable for polymeric materials. The S-4700 is configured to detect secondary and backscattered electrons as well as characteristic X-rays. The system is fully automated and is operated via easy-to-use menu driven software. Specifications:

  • Accelerating voltage range: from 0.5 keV to 30 keV.

  • 2.5 nm resolution at 1kV; 1.5 nm resolution at 15 kV.

  • Magnification range: from 30X to 500.000X.

  • PC-controlled five axis motorized stage.

  • Specimen stage rotation 360˚ in continuous mode.

  • Specimen tilt at 12mm working distance (WD) up to 45

  • Electron gun…. Cold cathode FE type

  • Extracting voltage… 0 to 6.5 KV

  • Type II stage

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Hitachi S3000N Variable Pressure Scanning Electron Microscope